Springmicrograph

Springmicrograph - suite of programs that work with micrographs

• Scansplit

Program to split large scan into individual micrographs. The location of individual micrographs is determined by a dummy micrograph reference.

• Micexam

Program to examine micrograph quality by computing a localized power spectrum using EMAN2’s e2scaneval.py and an averaged power spectrum from overlapping tiles using SPARX’ sx_welch_pw2.py

• Michelixtrace

Program to trace helices from micrographs

• Michelixtracegrid

Program to optimize michelixtrace by varying michelixtrace parameters systematically on a grid

• Micctfdetermine

Program to determine CTF parameters from a set of micrographs using CTFFIND and CTFTILT (Mindell and Grigorieff JSB, 2003)

• Scanrowcolcorr

Program to evaluate the performance of scanner by correlating adjacent rows and lines with each other from a pure noise image.

• Scandotfit

Program to evaluate performance of scanner by measuring dots spaced 2.5 mm apart.

• Scanlinefit

Program to evaluate scanner performance of scanner by measuring deviation from 45 degree line to determine CCD curvature and pincushion parameter.